Author: Patrick O'Connor,Patrick D. T. O'Connor,Andre Kleyner
Publisher: John Wiley & Sons
Category: Technology & Engineering
With emphasis on practical aspects of engineering, this bestsellerhas gained worldwide recognition through progressive editions asthe essential reliability textbook. This fifth editionretains the unique balanced mixture of reliability theory andapplications, thoroughly updated with the latest industry bestpractices. Practical Reliability Engineering fulfils therequirements of the Certified Reliability Engineer curriculum ofthe American Society for Quality (ASQ). Each chapter is supportedby practice questions, and a solutions manual is available tocourse tutors via the companion website. Enhanced coverage of mathematics of reliability, physics offailure, graphical and software methods of failure data analysis,reliability prediction and modelling, design for reliability andsafety as well as management and economics of reliabilityprogrammes ensures continued relevance to all quality assurance andreliability courses. Notable additions include: New chapters on applications of Monte Carlo simulation methodsand reliability demonstration methods. Software applications of statistical methods, includingprobability plotting and a wider use of common software tools. More detailed descriptions of reliability predictionmethods. Comprehensive treatment of accelerated test data analysis andwarranty data analysis. Revised and expanded end-of-chapter tutorial sections toadvance students’ practical knowledge. The fifth edition will appeal to a wide range of readers fromcollege students to seasoned engineering professionals involved inthe design, development, manufacture and maintenance of reliableengineering products and systems. www.wiley.com/go/oconnor_reliability5
In today’s sophisticated world, reliability stands as the ultimate arbiter of quality. An understanding of reliability and the ultimate compromise of failure is essential for determining the value of most modern products and absolutely critical to others, large or small. Whether lives are dependent on the performance of a heat shield or a chip in a lab, random failure is never an acceptable outcome. Written for practicing engineers, Practical Reliability Engineering and Analysis for System Design and Life-Cycle Sustainment departs from the mainstream approach for time to failure-based reliability engineering and analysis. The book employs a far more analytical approach than those textbooks that rely on exponential probability distribution to characterize failure. Instead, the author, who has been a reliability engineer since 1970, focuses on those probability distributions that more accurately describe the true behavior of failure. He emphasizes failure that results from wear, while considering systems, the individual components within those systems, and the environmental forces exerted on them. Dependable Products Are No Accident: A Clear Path to the Creation of Consistently Reliable Products Taking a step-by-step approach that is augmented with current tables to configure wear, load, distribution, and other essential factors, this book explores design elements required for reliability and dependable systems integration and sustainment. It then discusses failure mechanisms, modes, and effects—as well as operator awareness and participation—and also delves into reliability failure modeling based on time-to-failure data considering a variety of approaches. From there, the text demonstrates and then considers the advantages and disadvantages for the stress-strength analysis approach, including various phases of test simulation. Taking the practical approach still further, the author covers reliability-centered failure analysis, as well as condition-based and time-directed maintenance. As a science, reliability was once considered the plaything of statisticians reporting on time-to-failure measurements, but in the hands of a practicing engineer, reliability is much more than the measure of an outcome; it is something to be achieved, something to quite purposely build into a system. Reliability analysis of mechanical design for structures and dynamic components demands a thorough field-seasoned approach that first looks to understand why a part fails, then learns how to fix it, and finally learns how to prevent its failing. Ultimately, reliability of mechanical design is based on the relationship between stress and strength over time. This book blends the common sense of lessons learned with mechanical engineering design and systems integration, with an eye toward sustainment. This is the stuff that enables organizations to achieve products valued for their world-class reliability.
A newly revised and updated edition that details both thetheoretical foundations and practical applications of reliabilityengineering Reliability is one of the most important quality characteristicsof components, products, and large and complex systems—but ittakes a significant amount of time and resources to bringreliability to fruition. Thoroughly classroom- and industry-tested,this book helps ensure that engineers see reliability success withevery product they design, test, and manufacture. Divided into three parts, Reliability Engineering, SecondEdition handily describes the theories and their practical useswhile presenting readers with real-world examples and problems tosolve. Part I focuses on system reliability estimation for timeindependent and failure dependent models, helping engineers createa reliable design. Part II aids the reader in assembling necessarycomponents and configuring them to achieve desired reliabilityobjectives, conducting reliability tests on components, and usingfield data from similar components. Part III follows what happensonce a product is produced and sold, how the manufacturer mustensure its reliability objectives by providing preventive andscheduled maintenance and warranty policies. This Second Edition includes in-depth and enhancedchapter coverage of: Reliability and Hazard Functions System Reliability Evaluation Time- and Failure-Dependent Reliability Estimation Methods of the Parameters of Failure-TimeDistributions Parametric Reliability Models Models for Accelerated Life Testing Renewal Processes and Expected Number of Failures Preventive Maintenance and Inspection Warranty Models Case Studies A comprehensive reference for practitioners and professionals inquality and reliability engineering, Reliability Engineeringcan also be used for senior undergraduate or graduate courses inindustrial and systems, mechanical, and electrical engineeringprograms.
Mohammad Modarres,Mark P. Kaminskiy,Vasiliy Krivtsov
Author: Mohammad Modarres,Mark P. Kaminskiy,Vasiliy Krivtsov
Publisher: CRC Press
Category: Technology & Engineering
This undergraduate and graduate textbook provides a practical and comprehensive overview of reliability and risk analysis techniques. Written for engineering students and practicing engineers, the book is multi-disciplinary in scope. The new edition has new topics in classical confidence interval estimation; Bayesian uncertainty analysis; models for physics-of-failure approach to life estimation; extended discussions on the generalized renewal process and optimal maintenance; and further modifications, updates, and discussions. The book includes examples to clarify technical subjects and many end of chapter exercises. PowerPoint slides and a Solutions Manual are also available.
Authored by a practicing reliability engineer with over 25 years of experience, this book provides useful insights and a practical analysis that can be used to deal with reliability problems in designs. Practical Reliability Analysis makes use of both case studies and illustrative examples to teach readers through the use of practical applications. Features include: Case studies--provide practical applications of problem-solving techniques Mathematical analysis--demonstrates useful applications of statistical analysis in reliability problems Pictorial description of mechanical reliability--demonstrates common mechanical failures of electrical components Confidence limits--uses graphical examples to make this difficult subject clear
Getting the Job Done from Requirement through Acceptance
Author: Jerome Klion
Publisher: Springer Science & Business Media
Category: Technology & Engineering
This book is intended for the engineer or engineering student with little or no prior background in reliability. Its purpose is to provide the background material and guidance necessary to comprehend and carry out all the tasks associated with a reliability program from specification generation to final demonstration of reliability achieved. Most available texts on reliability concentrate on the mathematics and statistics used for reliability analysis, evaluation, and demonstration. They are more often suited more for the professional with a heavier mathematical background that most engineers have, and more often than not, ignore or pay short-shrift to basic engineering design and organizational efforts associated with a reliability program. A reliability engineer must be familiar with both the mathematics and engineering aspects of a reliability program. This text: 1. Describes the mathematics needed for reliability analysis, evaluation, and demonstration commensurate with an engineer's background. 2. Provides background material, guidance, and references necessary to the structure and implementation of a reliability program including: • identification of the reliability standards in most common use • how to generate and respond to a reliability specification • how reliability can be increased • the tasks which make up a reliability program and how to judge the need and scope of each; how each is commonly performed; caution and comments about their application.
The first book that explains why managing engineering is more difficult, more demanding and more important than managing any other human activity in modern society. It explains how, by adhering to the principles taught by Peter F. Drucker in his landmark book "The Practice of Management," managers can exploit the full potentials of their peoples' talents and of changing technologies, methods and markets. It brings together the whole range of methods used by the world's best performing engineering companies, including research, design, development, testing, production and maintenance. The philosophy and methods for achieving excellence in quality and reliability are fully described. The book offers fresh insights into a wide range of current engineering management issues, including education, MBA training, quality and safety standards and the roles of institutions, cultures and governments in engineering.
Designed to be used in engineering education and industrial practice, this book provides a comprehensive presentation of reliability engineering for optimized design engineering of products, parts, components and equipment.
Product reliability engineering from concept to marketplace In today's global, competitive business environment, reliability professionals are continually challenged to improve reliability, shorten design cycles, reduce costs, and increase customer satisfaction. "Life Cycle Reliability Engineering" details practical, effective, and up-to-date techniques to assure reliability throughout the product life cycle, from planning and designing through testing and warranting performance. These techniques allow ongoing quality initiatives, including those based on Six Sigma and the Taguchi methods, to yield maximized output. Complete with real-world examples, case studies, and exercises, this resource covers: Reliability definition, metrics, and product life distributions (exponential, Weibull, normal, lognormal, and more) Methodologies, tools, and practical applications of system reliability modeling and allocation Robust reliability design techniques Potential failure mode avoidance, including Failure Mode and Effects Analysis (FMEA) and Fault Tree Analysis (FTA) Accelerated life test methods, models, plans, and data analysis techniques Degradation testing and data analysis methods, covering both destructive and nondestructive inspections Practical methodologies for reliability verification and screening Warranty policies, data analysis, field failure monitoring, and warranty cost reduction All reliability techniques described are immediately applicable to product planning, designing, testing, stress screening, and warranty analysis. This book is a must-have resource for engineers and others responsible for reliability and quality and for graduate students in quality and reliability engineering courses.
Multi-state System Reliability Analysis and Optimization for Engineers and Industrial Managers presents a comprehensive, up-to-date description of multi-state system (MSS) reliability as a natural extension of classical binary-state reliability. It presents all essential theoretical achievements in the field, but is also practically oriented. New theoretical issues are described, including: • combined Markov and semi-Markov processes methods, and universal generating function techniques; • statistical data processing for MSSs; • reliability analysis of aging MSSs; • methods for cost-reliability and cost-availability analysis of MSSs; and • main definitions and concepts of fuzzy MSS. Multi-state System Reliability Analysis and Optimization for Engineers and Industrial Managers also discusses life cycle cost analysis and practical optimal decision making for real world MSSs. Numerous examples are included in each section in order to illustrate mathematical tools. Besides these examples, real world MSSs (such as power generating and transmission systems, air-conditioning systems, production systems, etc.) are considered as case studies. Multi-state System Reliability Analysis and Optimization for Engineers and Industrial Managers also describes basic concepts of MSS, MSS reliability measures and tools for MSS reliability assessment and optimization. It is a self-contained study resource and does not require prior knowledge from its readers, making the book attractive for researchers as well as for practical engineers and industrial managers.
Create, deploy, and manage applications at scale using SRE principles Key Features Build and run highly available, scalable, and secure software Explore abstract SRE in a simplified and streamlined way Enhance the reliability of cloud environments through SRE enhancements Book Description Site reliability engineering (SRE) is being touted as the most competent paradigm in establishing and ensuring next-generation high-quality software solutions. This book starts by introducing you to the SRE paradigm and covers the need for highly reliable IT platforms and infrastructures. As you make your way through the next set of chapters, you will learn to develop microservices using Spring Boot and make use of RESTful frameworks. You will also learn about GitHub for deployment, containerization, and Docker containers. Practical Site Reliability Engineering teaches you to set up and sustain containerized cloud environments, and also covers architectural and design patterns and reliability implementation techniques such as reactive programming, and languages such as Ballerina and Rust. In the concluding chapters, you will get well-versed with service mesh solutions such as Istio and Linkerd, and understand service resilience test practices, API gateways, and edge/fog computing. By the end of this book, you will have gained experience on working with SRE concepts and be able to deliver highly reliable apps and services. What you will learn Understand how to achieve your SRE goals Grasp Docker-enabled containerization concepts Leverage enterprise DevOps capabilities and Microservices architecture (MSA) Get to grips with the service mesh concept and frameworks such as Istio and Linkerd Discover best practices for performance and resiliency Follow software reliability prediction approaches and enable patterns Understand Kubernetes for container and cloud orchestration Explore the end-to-end software engineering process for the containerized world Who this book is for Practical Site Reliability Engineering helps software developers, IT professionals, DevOps engineers, performance specialists, and system engineers understand how the emerging domain of SRE comes handy in automating and accelerating the process of designing, developing, debugging, and deploying highly reliable applications and services.
A Practical Approach to High Power and Single Mode Devices
Author: Peter W. Epperlein
Publisher: John Wiley & Sons
Category: Technology & Engineering
This reference book provides a fully integrated novel approachto the development of high-power, single-transverse mode,edge-emitting diode lasers by addressing the complementary topicsof device engineering, reliability engineering and devicediagnostics in the same book, and thus closes the gap in thecurrent book literature. Diode laser fundamentals are discussed, followed by an elaboratediscussion of problem-oriented design guidelines and techniques,and by a systematic treatment of the origins of laser degradationand a thorough exploration of the engineering means to enhance theoptical strength of the laser. Stability criteria of critical lasercharacteristics and key laser robustness factors are discussedalong with clear design considerations in the context ofreliability engineering approaches and models, and typical programsfor reliability tests and laser product qualifications. Novel,advanced diagnostic methods are reviewed to discuss, for the firsttime in detail in book literature, performance- andreliability-impacting factors such as temperature, stress andmaterial instabilities. Further key features include: practical design guidelines that consider also reliabilityrelated effects, key laser robustness factors, basic laserfabrication and packaging issues; detailed discussion of diagnostic investigations of diodelasers, the fundamentals of the applied approaches and techniques,many of them pioneered by the author to be fit-for-purpose andnovel in the application; systematic insight into laser degradation modes such ascatastrophic optical damage, and a wide range of technologies toincrease the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliabilityengineering with details on a standard commercial high power laserreliability test program. Semiconductor Laser Engineering, Reliability andDiagnostics reflects the extensive expertise of the author inthe diode laser field both as a top scientific researcher as wellas a key developer of high-power highly reliable devices. Withinvaluable practical advice, this new reference book is suited topractising researchers in diode laser technologies, and topostgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his ownsemiconductor technology consulting businessPwe-PhotonicsElectronics-IssueResolution in the UK. He looks backat a thirty years career in cutting edge photonics and electronicsindustries with focus on emerging technologies, both in global andstart-up companies, including IBM, Hewlett-Packard, AgilentTechnologies, Philips/NXP, Essient Photonics and IBM/JDSU LaserEnterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr.rer. nat. (Ph.D.) degrees in physics, magna cum laude, from theUniversity of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert incompound semiconductor and diode laser technologies. He hasaccomplished R&D in many device areas such as semiconductorlasers, LEDs, optical modulators, quantum well devices, resonanttunneling devices, FETs, and superconducting tunnel junctions andintegrated circuits. His pioneering work on sophisticateddiagnostic research has led to many world’s first reports andhas been adopted by other researchers in academia and industry. Heauthored more than seventy peer-reviewed journal papers, publishedmore than ten invention disclosures in the IBM Technical DisclosureBulletin, has served as reviewer of numerous proposals forpublication in technical journals, and has won five IBM ResearchDivision Awards. His key achievements include the design andfabrication of high-power, highly reliable, single mode diodelasers. Book Reviews “Semiconductor Laser Engineering, Reliability andDiagnostics: A Practical Approach to High Power and Single ModeDevices”. By Peter W. Epperlein Prof. em. Dr. Heinz Jäckel, High Speed Electronics andPhotonics, Swiss Federal Institute of Technology ETHZürich, Switzerland The book “Semiconductor Laser Engineering, Reliabilityand Diagnostics” by Dr. P.W. Epperlein is a landmark in therecent literature on semiconductor lasers because it fills alongstanding gap between many excellent books on laser theory andthe complex and challenging endeavor to fabricate these devicesreproducibly and reliably in an industrial, real worldenvironment. Having worked myself in the early research and development ofhigh power semiconductor lasers, I appreciate the competent,complete and skillful presentation of these three highlyinterrelated topics, where small effects have dramatic consequenceson the success of a final product, on the ultimate performance andon the stringent reliability requirements, which are the name ofthe game. As the title suggests the author addresses three tightlyinterwoven and critical topics of state-of-the-art power laserresearch. The three parts are: device and mode stabilityengineering (chapter 1, 2), reliability mechanisms and reliabilityassessment strategies (chapter 3, 4, 5, 6) and finally material anddevice diagnostics (chapter 7, 8, 9) all treated with a strongfocus on the implementation. This emphasis on the complex practicalaspects for a large-scale power laser fabrication is a truehighlight of the book. The subtle interplay between laser design, reliabilitystrategies, advanced failure analysis and characterizationtechniques are elaborated in a very rigorous and scientific wayusing a very clear and easy to read representation of the complexinterrelation of the three major topics. I will abstain from tryingto provide a complete account of all the topics but mainlyconcentrate on the numerous highlights. The first part 1 “Laser Engineering” is dividedin two chapters on basic electronic-optical, structural, materialand resonator laser engineering on the one side, and on single modecontrol and stability at very high, still reliable power-levelswith the trade-off between mirror damage, single mode stability onthe other side. To round up the picture less well-known conceptsand the state-of-the-art of large-area lasers, which can be forcedinto single-mode operation, are reviewed carefully. The subtle andcomplex interplay, which is challenging to optimize for a designfor reliability and low stress as a major boundary condition iscrucial for the design. The section gives a rather complete andwell-referenced account of all relevant aspects, relations andtrade-offs for understanding the rest of the book. The completeness of the presentation on power laser diodedesign based on basic physical and plausible arguments is mainlybased on analytic mathematical relations as well as experimentsproviding a new and well-balanced addition for the power diodelaser literature in particular. Modern 2D self-consistentelectro-optical laser modeling including carrier hole burning andthermal effects – this is important because the weak opticalguiding and gain-discrimination depend critically on rather smallquantities and effects, which are difficult to optimizeexperimentally – is used in the book for simulation results,but is not treated separately. The novel and really original, “gap-filling” bulkof the book is elaborated by the author in a very clear way in thefollowing four chapters in the part 2 “LaserReliability” on laser degradation physics and mirror designand passivation at high power, followed then by two veryapplication oriented chapters on reliability design engineering andpractical reliability strategies and implementation procedures.This original combination of integral design and reliabilityaspects – which are mostly neglected in standardliterature – is certainly a major plus of this book. I likedthis second section as a whole, because it provides excellentinsights in degradation physics on a high level and combines it inan interesting and skillful way with the less“glamorous” (unfortunately) but highly relevantreliability science and testing strategies, which is particularlyimportant for devices operating at extreme optical stresses withchallenging lifetime requirements in a real wordenvironment. Finally, the last part 3 “Laser Diagnostics”comprising three chapters, is devoted mainly to advancedexperimental diagnostics techniques for material integrity,mechanical stress, deep level defects, various dynamic laserdegradation effects, surface- and interface quality, and mostimportantly heating and disordering of mirrors and mirror coatings.The topics of characterization techniques comprising micro-Raman-and micro-thermoreflectance-probing, 2K photoluminescencespectroscopy, micro-electroluminescence and photoluminescencescanning, and deep-level-transient spectroscopy have been pioneeredby the author for the specific applications over many yearsguaranteeing many competent and well represented insights. Thesetechniques are brilliantly discussed and the informationdistributed in many articles by the author has been successfullyunified in a book form. In my personal judgment and liking, I consider the parts 2and 3 on reliability and diagnostics as the most valuable and truenovel contribution of the book, which in combination with theextremely well-covered laser design of part 1 clearly fill the gapin the current diode laser literature, which in this detail hascertainly been neglected in the past. In summary, I can highly recommend this excellent,well-organized and clearly written book to readers who are alreadyfamiliar with basic diode laser theory and who are active in theacademic and industrial fabrication and characterization ofsemiconductor lasers. Due to its completeness, it also serves as anexcellent reference of the current state-of-the-art in reliabilityengineering and device and material diagnostics. Needless to mention that the quality of the book, itsrepresentations and methodical structure meet the highestexpectation and are certainly a tribute from the long and broadexperience of the author in academic laser science and theindustrial commercialization of high power diode lasers. In my opinion, this book was a pleasure to read and due toits quality and relevance deserves a large audience in the powerdiode laser community! Prof. em. Dr. Heinz Jäckel, High Speed Electronicsand Photonics, Swiss Federal Institute of Technology ETHZürich, Switzerland June 16, 2013 ========================================== “Semiconductor Laser Engineering, Reliability andDiagnostics: A Practical Approach to High Power and Single ModeDevices”. By Peter W. Epperlein Dr. Chung-en Zah, Research Director,Semiconductor Technologies Research, S&T Division,Corning Incorporate, Corning NY, USA This book covers for the first time the three closelyinterrelated key laser areas of engineering (design), reliabilityand diagnostics in one book, written by the well-known practitionerin cutting-edge optoelectronics industries, Dr. Peter W. Epperlein.The book closes the gap in the current book literature and is thusa unique and excellent example of how to merge design, reliabilityand diagnostics aspects in a very professional, profound andcomplete manner. All physical and technological principles,concepts and practical aspects required for developing andfabricating highly-reliable high-power single-mode laser productsare precisely specified and skilfully formulated along with all thenecessary equations, figures, tables and worked-out examples makingit easy to follow through the nine chapters. Hence, this uniquebook is a milestone in the diode laser literature and is anexcellent reference book not only for diode laser researchers andengineers, but also diode laser users. The engineering part starts with a very informative andclear, well-presented account of all necessary basic diode lasertypes, principles, parameters and characteristics for an easy andquick understanding of laser functionality within the context ofthe book. Along with an elaborate and broad discussion of relevantlaser material systems, applications, typical output powers,power-limiting factors and reliability tradeoffs, basic fabricationand packaging technologies, this excellent introductory section iswell suited to become quickly and easily familiar with practicalaspects and issues of diode laser technologies. Of specialimportance and high usefulness is the first analytic andquantitative discussion in a book on issues of coupling laser powerinto optical single mode fibers. The second section discusses in awell-balanced, competent and skilful way waveguide topics such asbasic high-power design approaches, transverse vertical and lateralwaveguide concepts, stability of the fundamental transverse lateralmode and fundamental mode waveguide optimization techniques byconsidering detrimental effects such as heating, carrier injection,spatial hole burning, lateral current spreading and gain profilevariations. Less well-known approaches to force large-area lasersinto a single mode operation are well-identified and carefullydiscussed in depth and breadth. All these topics are elaborated ina very complete, rigorous and scientific way and are clearlyarticulated and easy to read. In particular, the book works out thecomplex interaction between the many different effects to optimizehigh-power single-mode performance at ultimate reliability and thusis of great benefit to every researcher and engineer engaged inthis diode laser field. Another novelty and highlight is, for the first time ever inbook form, a comprehensive yet concise discussion of diode laserreliability related issues. These are elaborated in four distinctchapters comprising laser degradation physics and modes, opticalstrength enhancement approaches including mirrorpassivation/coating and non-absorbing mirror technologies, followedby two highly relevant product-oriented chapters on reliabilitydesign engineering concepts and techniques and an elaboratereliability test plan for laser chip and module productqualification. This original and novel approach to link laserdesign to reliability aspects and requirements provides both, mostuseful insight into degradation processes such as catastrophicoptical mirror damage on a microscopic scale, and a wide selectionof effective remedial actions. These accounts, which are of highestsignificance for lasers operating at the optical stress limit dueto extremely high output power densities and most demandinglifetime requirements are very professionally prepared anddiscussed in an interesting, coherent and skilfulmanner. The diagnostics part, consisting of three very elaboratechapters, is most unique and novel with respect to other diodelaser books. It discusses for the first time ever on a very highlevel and in a competent way studies on material integrity,impurity trapping effects, mirror and cavity temperatures, surface-and interface quality, mirror facet disorder effects, mechanicalstress and facet coating instability, and diverse laser temperatureeffects, dynamic laser degradation effects and mirror temperaturemaps. Of highest significance to design, performance andreliability are the various correlations established between laserdevice and material parameters. The most different andsophisticated experiments, carried out by the author at micrometerspatial resolutions and at temperatures as low as 2K, providehighly valuable insights into laser and material qualityparameters, and reveal for the first time the origins of high powerlimitations on an atomic scale due to local heating effects anddeep level defects. It is of great benefit, that the experimentaltechniques such as Raman spectroscopy, various luminescencetechniques, thermoreflectance and deep-level transientspectroscopy, pioneered by the author for the specific experimentson lasers, are discussed with great expertise in depth and breadth,and the numerous paper articles published by the author are nowrepresented in this book. The book has an elaborate table of contents and index, whichare very useful, over 200 illustrative figures and tables, andextensive lists of references to all technical topics at the end ofeach of the nine chapters, which make it easy to follow from coverto cover or by jumping in at random areas of special interest.Moreover, experimental and theoretical concepts are alwaysillustrated by practical examples and data. I can highly recommend this extremely relevant,well-structured and well-formulated book to all practisingresearchers in industrial and academic diode laser R&Denvironments and to post-graduate engineering students interestedin the actual problems of designing, manufacturing, testing,characterising and qualifying diode lasers. Due to its completenessand novel approach to combine design, reliability and diagnosticsin the same book, it can serve as an ideal reference book as well,and it deserves to be welcomed wordwide by the addressedaudience. Dr. Chung-en Zah, Research Director, SemiconductorTechnologies Research, S&T Division, Corning Incorporate,Corning NY, USA =========================================== “Semiconductor Laser Engineering, Reliability andDiagnostics: A Practical Approach to High Power and Single ModeDevices”. By Peter W. Epperlein Cordinatore Prof. Lorenzo Pavesi, UNIVERSITÀ DEGLI STUDIDI TRENTO, Dipartimento di Fisica / Laboratorio di Nanoscienze This book represents a well thought description of threefundamental aspects of laser technology: the functioningprinciples, the reliability and the diagnostics. From this point ofview, and, as far as I know, this is a unique example of a bookwhere all these aspects are merged together resulting in awell-balanced presentation. This helps the reader to move with easebetween different concepts since they are presented in a coherentmanner and with the same terminology, symbols anddefinitions. The book reads well. Despite the subtitle indicates that itis a practical approach, the book is also correct from a formalpoint of view and presents the necessary equations and derivationsto understand both the physical mechanisms and the practicalitiesvia a set of useful formulas. In addition, there is the moreimportant aspect of many real-life examples of how a laser isactually manufactured and which the relevant parameters thatdetermine its behaviour are. It impresses the amounts ofinformation that are given in the book: this would be more typicalof a thick handbook on semiconductor laser than of an agile book.Dr. Epperlein was able to identify the most important concepts andto present them in a clear though concise way. I am teaching a course on Optoelectronics and I'm going toadvise students to refer to this book, because it has all thenecessary concepts and derivations for a systematic understandingof semiconductor lasers with many worked-out examples, which willhelp the student to grasp the actual problems of designing,manufacturing, testing and using semiconductor lasers. All thevarious concepts are joined to very useful figures, which, ifprovided to instructors as files, can be a useful add-on for theuse of the book as text for teaching. Concepts are always detailedwith numbers to give a feeling of their practical use. In conclusion, I do find the book suitable for my teachingduties and will refer it to my students. Prof. Dr. Lorenzo Pavesi, Head of the Department ofPhysics, Head of the Nanoscience Laboratory, University of Trento,Italy 31 May 2013 =========================================== “Semiconductor Laser Engineering, Reliability andDiagnostics: A Practical Approach to High Power and Single ModeDevices”. By Peter W. Epperlein Robert W. Herrick, Ph.D., Senior Component ReliabilityEngineer, Intel Corp., Santa Clara, California, USA Dr. Epperlein has done the semiconductor laser community agreat service, by releasing the most complete book on the market onthe practical issues of how to make reliable semiconductorlasers. While dozens of books have been written over the past coupleof decades on semiconductor laser design, only a handful have beenwritten on semiconductor laser reliability. Prior to the release ofthis book, perhaps 40% of the material could be obtained elsewhereby combining five books: one on laser design, one on laserreliability, one on reliability calculations, and a couple of laserreview books. Another 40% could be pieced together bycollecting 50 -100 papers on the subjects of laser design, laserfabrication, characterization, and reliability. The remaining 20%have not previously been covered in any comprehensive way. Only the introductory material in the first half of the firstchapter has good coverage elsewhere. The large majority of theknowledge in this book is generally held as “tradesecret” by those with the expertise in the field, and most ofthose in the know are not free to discuss. The author was fortunateenough to work for the first half of his career in the IBM researchlabs, with access to unparalleled resources, and the ability topublish his work without trade secret restrictions. The results arestill at the cutting edge of our understanding of semiconductorlaser reliability today, and go well beyond the empirical“black box” approach many use of “try everything,and see what works.” The author did a fine job of pullingtogether material from many disparate fields. Dr. Epperlein has particular expertise in high power singlemode semiconductor lasers, and those working on those type oflasers will be especially interested in this book, as there hasnever been a book published on the fabrication and qualification ofsuch lasers before. But those in almost any field ofsemiconductor lasers will learn items of interest about devicedesign, fabrication, reliability, and characterization. Unlike most other books, which intend to convey the scientificfindings or past work of the author, this one is written more as a“how to” manual, which should make it more accessibleand useful to development engineers and researchers in the field.It also has over 200 figures, which make it easier to follow. As with many books of this type, it is not necessary to read itfrom cover-to-cover; it is best skimmed, with deep diving into anyareas of special interest to the reader. The book isremarkable also for how comprehensive it is – even expertswill discover something new and useful. Dr. Epperlein’s book is an essential read for anyonelooking to develop semiconductor lasers for anything other thanpure research use, and I give it my highest recommendation. Robert W. Herrick, Ph.D., Senior Component ReliabilityEngineer, Intel Corp., Santa Clara, California, USA
Focuses on the core systems engineering tasks of writing,managing, and tracking requirements for reliability,maintainability, and supportability that are most likely to satisfycustomers and lead to success for suppliers This book helps systems engineers lead the development ofsystems and services whose reliability, maintainability, andsupportability meet and exceed the expectations of their customersand promote success and profit for their suppliers. This book isorganized into three major parts: reliability, maintainability, andsupportability engineering. Within each part, there is material onrequirements development, quantitative modelling, statisticalanalysis, and best practices in each of these areas. Heavy emphasisis placed on correct use of language. The author discusses the useof various sustainability engineering methods and techniques incrafting requirements that are focused on the customers’needs, unambiguous, easily understood by the requirements’stakeholders, and verifiable. Part of each major division of thebook is devoted to statistical analyses needed to determine whenrequirements are being met by systems operating in customerenvironments. To further support systems engineers in writing,analyzing, and interpreting sustainability requirements, this bookalso Contains “Language Tips” to help systems engineerslearn the different languages spoken by specialists andnon-specialists in the sustainability disciplines Provides exercises in each chapter, allowing the reader to tryout some of the ideas and procedures presented in the chapter Delivers end-of-chapter summaries of the current reliability,maintainability, and supportability engineering best practices forsystems engineers Reliability, Maintainability, and Supportability is a referencefor systems engineers and graduate students hoping to learn how toeffectively determine and develop appropriate requirements so thatdesigners may fulfil the intent of the customer.
Examining numerous examples of highly sensitive products, this book reviews basic reliability mathematics, describes robust design practices, and discusses the process of selecting suppliers and components. He focuses on the specific issues of thermal management, electrostatic discharge, electromagnetic compatibility, printed wiring assembly, environmental stress testing, and failure analysis. The book presents methods for meeting the reliability goals established for the manufacture of electronic product hardware and addresses the development of reliable software. The appendix provides example guidelines for the derating of electrical and electromechanical components.