LabVIEW for Everyone

Graphical Programming Made Easy and Fun

Author: Jeffrey Travis

Publisher: Prentice-Hall PTR

ISBN:

Category: Computers

Page: 981

View: 180

For beginning and intermediate LabVIEW programmers, this introductory guide assumes no prior knowledge of LabVIEW. There are in-depth examples in every chapter, and all the answers and source code is provided on the accompanying CD-ROM.

The Essential Guide to Image Processing

Author: Alan C. Bovik

Publisher: Academic Press

ISBN:

Category: Computers

Page: 672

View: 878

A complete introduction to the basic and intermediate concepts of image processing from the leading people in the field Up-to-date content, including statistical modeling of natural, anistropic diffusion, image quality and the latest developments in JPEG 2000 This comprehensive and state-of-the art approach to image processing gives engineers and students a thorough introduction, and includes full coverage of key applications: image watermarking, fingerprint recognition, face recognition and iris recognition and medical imaging. "This book combines basic image processing techniques with some of the most advanced procedures. Introductory chapters dedicated to general principles are presented alongside detailed application-orientated ones. As a result it is suitably adapted for different classes of readers, ranging from Master to PhD students and beyond." – Prof. Jean-Philippe Thiran, EPFL, Lausanne, Switzerland "Al Bovik’s compendium proceeds systematically from fundamentals to today’s research frontiers. Professor Bovik, himself a highly respected leader in the field, has invited an all-star team of contributors. Students, researchers, and practitioners of image processing alike should benefit from the Essential Guide." – Prof. Bernd Girod, Stanford University, USA "This book is informative, easy to read with plenty of examples, and allows great flexibility in tailoring a course on image processing or analysis." – Prof. Pamela Cosman, University of California, San Diego, USA A complete and modern introduction to the basic and intermediate concepts of image processing – edited and written by the leading people in the field An essential reference for all types of engineers working on image processing applications Up-to-date content, including statistical modelling of natural, anisotropic diffusion, image quality and the latest developments in JPEG 2000

Mechanical Engineering and Control Systems

Proceedings of the 2015 International Conference on Mechanical Engineering and Control Systems (MECS2015)

Author: Xiaolong Li

Publisher: World Scientific

ISBN:

Category: Computers

Page: 544

View: 211

This book consists of 113 selected papers presented at the 2015 International Conference on Mechanical Engineering and Control Systems (MECS2015), which was held in Wuhan, China during January 23–25, 2015. All accepted papers have been subjected to strict peer review by two to four expert referees, and selected based on originality, ability to test ideas and contribution to knowledge. MECS2015 focuses on eight main areas, namely, Mechanical Engineering, Automation, Computer Networks, Signal Processing, Pattern Recognition and Artificial Intelligence, Electrical Engineering, Material Engineering, and System Design. The conference provided an opportunity for researchers to exchange ideas and application experiences, and to establish business or research relations, finding global partners for future collaborations. The conference program was extremely rich, profound and featured high-impact presentations of selected papers and additional late-breaking contributions. Contents:Mechanical Engineering and Manufacturing TechnologiesAutomation and Control EngineeringCommunication Networking and Computing TechnologiesSignal Processing and Image ProcessingPattern Recognition and Artificial IntelligenceMicro Electromechanical Systems Technology and ApplicationMaterial Science and Material EngineeringSystem Design and SimulationSustainable City and Sustainable Development Readership: Researchers and graduate students interested in mechanical engineering and control systems. Key Features:It is one of the leading international conferences for presenting novel and fundamental advances in the fields of Mechanical Engineering and Control SystemsThe proceedings put together the most up-to-date, comprehensive and worldwide state-of-the-art knowledge in Mechanical Engineering and Control SystemsMany of the articles are the output of research funded by Chinese research agencies, representing the state-of-the-art technologies in Chinese engineering R&DKeywords:Mechanical Engineering;Automation;Computer Networks;Signal Processing;Pattern Recognitions and Artificial Intelligence;Electrical Engineering;Material Engineering;System Design

Model-Based Testing for Embedded Systems

Author: Justyna Zander

Publisher: CRC Press

ISBN:

Category: Computers

Page: 688

View: 517

What the experts have to say about Model-Based Testing for Embedded Systems: "This book is exactly what is needed at the exact right time in this fast-growing area. From its beginnings over 10 years ago of deriving tests from UML statecharts, model-based testing has matured into a topic with both breadth and depth. Testing embedded systems is a natural application of MBT, and this book hits the nail exactly on the head. Numerous topics are presented clearly, thoroughly, and concisely in this cutting-edge book. The authors are world-class leading experts in this area and teach us well-used and validated techniques, along with new ideas for solving hard problems. "It is rare that a book can take recent research advances and present them in a form ready for practical use, but this book accomplishes that and more. I am anxious to recommend this in my consulting and to teach a new class to my students." —Dr. Jeff Offutt, professor of software engineering, George Mason University, Fairfax, Virginia, USA "This handbook is the best resource I am aware of on the automated testing of embedded systems. It is thorough, comprehensive, and authoritative. It covers all important technical and scientific aspects but also provides highly interesting insights into the state of practice of model-based testing for embedded systems." —Dr. Lionel C. Briand, IEEE Fellow, Simula Research Laboratory, Lysaker, Norway, and professor at the University of Oslo, Norway "As model-based testing is entering the mainstream, such a comprehensive and intelligible book is a must-read for anyone looking for more information about improved testing methods for embedded systems. Illustrated with numerous aspects of these techniques from many contributors, it gives a clear picture of what the state of the art is today." —Dr. Bruno Legeard, CTO of Smartesting, professor of Software Engineering at the University of Franche-Comté, Besançon, France, and co-author of Practical Model-Based Testing

Transverse Disciplines in Metrology

Author: French College of Metrology

Publisher: Wiley-Iste

ISBN:

Category: Science

Page: 813

View: 786

Based on The International Metrology Congress meeting, this reference examines the evolution of metrology, and its applications in industry, environment and safety, health and medicine, economy and quality, and new information and communication technologies; details the?improvement of measurement procedures to guarantee the quality of products and processes; and discusses the?development of metrology linked to innovating technologies. The themes of the Congress (quality and reliability of measurement, measurement uncertainties, calibration, verification, accreditation, sensory metrology, regulations and legal metrology) are developed either in a general way or applied to a specific economic sector or to a specific scientific field.